常用分析方法簡(jiǎn)寫(xiě)

1、26位國(guó)產(chǎn)熒幕新位國(guó)產(chǎn)熒幕新“胸器胸器”爆乳走紅爆乳走紅ACFabsptioncrectionfact吸收校正因子ADanalogtodigital(converter)ADFannulardarkfield環(huán)形暗場(chǎng)AEManalyticalelectronmicroscopemicroscopy分析電子顯微鏡學(xué)AESAugerelectronspectrometerspectroscopy俄歇電子光譜儀學(xué)AFFaberrationfr

2、eefocus無(wú)像差焦點(diǎn)ALCHEMIatomlocationbychannelingenhancedmicroanalysisAPBantiphasedomainboundary反相疇界ATWatmosphericthinwindowBFbrightfield明場(chǎng)BFPbackfocalplane后焦面BSEbackscatteredelectron背散射電子BSEDbackscatteredelectrondiffraction背散

3、射電子衍射BZBBrillouinzoneboundaryC(12etc..)condenser(l2etc.)lens第1，2...聚光鏡CBcoherentbremsstrahlungCBEDconvergentbeamelectrondiffraction會(huì)聚束電子衍射CBIMconvergentbeamimaging會(huì)聚束成像CCDgecoupleddevice電荷耦合裝置CCFcrosscrelationfunction互相關(guān)

4、函數(shù)CCMgecollectionmicroscopyCDFcentereddarkfield中心暗場(chǎng)像CFcoherentFennelFoucaultCFEGcoldfieldemissiongun冷場(chǎng)發(fā)射槍CLcathodeluminescence陰極發(fā)光CRTcathoderaytube陰極射線管CScrystallographicshear晶體學(xué)切變CSLcoincidentsitelatticeDFdarkfield暗場(chǎng)DOS

5、densityofstates態(tài)密度DPdiffractionpattern衍射花樣DQEdetectionofquantumefficiency量子探測(cè)效率DSTEMdedicatedscanningtransmissionelectronmicroscope專(zhuān)業(yè)掃描透射電子顯微鏡DTSAdesktopspectrumanalyzerEBICelectronbeaminducedcurrentconductivityEELSelect

6、ronenergylossspectrometry電子能量損失譜EFIenergyfilteredimaging能量過(guò)濾成像ELNESenergylossnearedgestructure能量損失近邊結(jié)構(gòu)ELPenergylossprogram(Gatan)EMMAelectronmicroscopemicroanalyzerOTEDPobliquetexturedelectrondiffractionpatternPBphasebou

7、ndary相界PBpeaktobackgroundratio峰背比PEELSparallelelectronenergylossspectrometerspectroscopy并聯(lián)電子能量損失譜儀學(xué)PIMSPrecisionIonMillingSystemPIPSPrecisionIonPolishingSystemPMphotomultiplier光電倍增器POAphaseobjectapproximation相位物近似QHRTEMq

8、uantitativehighresolutiontransmissionelectronmicrosc.定量高分辨透射電子顯微學(xué)RBtranslationboundary(yesitdoes!)RCProckingbeamchannelingpatternsRDFradialdistributionfunctionREMreflectionelectronmicroscopemicroscopy反射電子顯微鏡學(xué)RHEEDreflect

9、ionhighenergyelectrondiffraction反射高能電子衍射RHFrelativisticHartreeFockRHFSrelativisticHartreeFockSlaterSADedareadiffraction選區(qū)衍射SEsecondaryelectron二次電子SEELSserialelectronenergylossspectrometerspectrometry串聯(lián)電子能量損失譜儀學(xué)SEMscannin

10、gelectronmicroscopemicroscopy掃描電子顯微鏡學(xué)SFstackingfault堆垛層錯(cuò)SHRLIsimulatedhighresolutionlatticeimages程序的名稱(chēng)SIMSsecondaryionmassspectrometrySNsignaltonoiseratio信噪比SOLZsecondderLauezone二階勞埃區(qū)SRMstardreferencematerialSTEMscanning

11、transmissionelectronmicroscopemicroscopy掃描透射電子顯微鏡學(xué)STMscanningtunnelingmicroscopemicroscopy掃描隧道電子顯微鏡學(xué)TBtwinboundary攣晶界TEMtransmissionelectronmicroscopemicroscopy透射電子顯微鏡學(xué)TMBAtoomanybloodyacronymsUHVultrahighvacuum超高真空UTWul